NI, the provider of platform-based systems that enable engineers
and scientists to solve the world’s greatest engineering challenges, announced
today the release of its Automated Test Outlook 2016. The annual test and
measurement report delivers a comprehensive view of the key trends expected to
impact automated test environments with the proliferation of connected devices,
from preparing to test mmWave communication to effectively using manufacturing
test data to propel business results.
“As strong advocates for excellence in automated test, we work
closely with customers and suppliers to understand the top issues facing manufacturing
and test departments,” said Jayaram Pillai, Managing Director India at National
Instruments. “Whether your challenge is testing millions of Internet of Things
devices or managing a 20-year-old test system, our goal is to spark dialogue
within your organization to help you lower the cost of test and stay ahead of
your competition.”
Automated Test Outlook 2016 explores the following topics:
COMPUTING: Harvesting Production Test Data
Semiconductor organizations pioneer real-time data analytics to
reduce manufacturing test cost.
SOFTWARE: Life-Cycle Management Is All About Software
Obsolescence, OS churn, and compatibility challenge long
life-cycle projects—an age-old problem warrants revisiting.
ARCHITECTURE: The Rise of Test Management Software
Off-the-shelf test executives are effective solutions for the
influx of new programming languages.
I/O: Standardizing Platforms from Characterization to Production
RFIC companies employ IP reuse and hardware standardization
across the product design cycle to reduce cost and shorten time to market.
Business Strategy: Making (mm)Waves in Test Strategy
Test managers are adopting modular solutions to economically
validate high-frequency components.
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